奈米電子技術發展趨勢

免費
出版作者 陳俊儒
出版單位 工研院IEK電子分項
出版日期 2006/01/06
出版類型 產業報告
所屬領域 半導體
瀏覽次數 634
加入購物車 直接下載 加入最愛
摘要

Semiconductor industry has achieved the most outstanding and fastest accomplishment within the last forty years since 1961. With the demand and evolution of technology in 3C market, the size of components will have to enter the scale of nanometer generation from micrometer to provide the improvement in speed, power, integration, and density. The feature size has advances from 250 nm, 180 nm, 130nm, and into the new 90 nm generation. ITRS forecasted that the 90 nm product will enter volume production in 2004. All global leading manufacturers are now aggressively engaging in this new manufacturing process. Companies such as Intel, IBM, TI, Toshiba, TSMC, and UMC, etc. have all started deploying 90 nm manufacturing process since 2003 in hope for the market winner. They have also all actively invested in the research of sub-90 nm manufacturing process to prepare for the forth-coming new generation.

This book discusses five technologies including Low dielectric constant material, Silicon on Insulator (SOI), MRAM, Atomic Layer Deposition (ALD), and EUV. The patent map, scientific literatures, and research projects are used for analysis to provide research topics related to nanometer electronics for the national scientific planning.. The global technological development trend is evaluated as the reference material for our country in setting policies for forward-looking technological research.

目錄

====章節目錄====

Chapter 1 Introduction

  Section 1 Goal of Research

  Section 2 Methods of Research

  Section 3 Structure of Research

Chapter 2 Low Dielectric Constant Material

  Section 1 Foreword

  Section 2 Patent Map Analysis

  Section 3 Scientific Literatures Analysis

  Section 4 Research Projects Analysis

  Section 5 Status of Leading Companies

  Section 6 Technical Assessment

Chapter 3 Silicon on Insulator (SOI)

  Section 1 Foreword

  Section 2 Patent Map Analysis

  Section 3 Scientific Literatures Analysis

  Section 4 Research Projects Analysis

  Section 5 Status of Leading Companies

  Section 6 Technical Assessment

Chapter 4 Magnetic Random Access Memory (MRAM)

  Section 1 Foreword

  Section 2 Patent Map Analysis

  Section 3 Scientific Literatures Analysis

  Section 4 Research Projects Analysis

  Section 5 Status of Leading Companies

  Section 6 Technical Assessment

Chapter 5 Atomic Layer Deposition (ALD)

  Section 1 Foreword

  Section 2 Patent Map Analysis

  Section 3 Scientific Literatures Analysis

  Section 4 Research Projects Analysis

  Section 5 Status of Leading Companies

  Section 6 Technical Assessment

Chapter 6 EUV Lithography

  Section 1 Foreword

  Section 2 Patent Map Analysis

  Section 3 Scientific Literatures Analysis

  Section 4 Research Projects Analysis

  Section 5 Status of Leading Companies

  Section 6 Technical Assessment

Chapter 7 Conclusion

  Section 1 Patent Map Analysis

  Section 2 Scientific Literatures Analysis

  Section 3 Research Projects Analysis

====表目錄====

Table 2-1 Technology Development Road Map of Low Dielectric Constant Material of ITRS

Table 3-1 Silicon wafer market price in 2003

Table 4-1 Characteristics comparison between MRAM and mainstream memory

Table 5-1 Market size and forecast of global thin film deposition equipment market.

Table 6-1 ITRS Lithography Roadmap

Table 6-2 Photolithography Technology Roadmap corrected by Intel

====圖目錄====

Figure 1-1 Structure of research

Figure 2-1 Historical patent numbers of low dielectric material

Figure 2-2 Number of Patents of low dielectric constant material published in the history

Figure 3-1 Historical number of SOI Patents

Figure 3-2 Number of Published Historical SOI Patents

Figure 3-3 Demand forecast of SOI wafers

Figure 4-1 Historical number of patents of MRAM

Figure 4-2 Number of Patents of MRAM published in the history

Figure 5-1 Global market distribution of semiconductor equipment

Figure 5-2 Historical number of patents of ALD

Figure 5-3 Number of Patents of ALD published in history

Figure 6-1 Historical number of EUV patents

Figure 6-2 Historical number of patents of EUV

Figure 6-3 shows the development schedule of LLC

Figure 6-4 EUVA development schedule

Figure 6-5 Illustration of reflective EUV optical system

Figure 6-6 Structure of EUV mask

Figure 7-1 Bubble diagram of number of patents for Nanoelectronics technology

Figure 7-2 Bubble diagram of Nanoelectronics technology for scientific literatures

Figure 7-3 Relationship between the number of research projects and amount of money invested into the Nanoelectronic technology by Taiwanese government.
章節檔案下載
第一章 Introduction
4
0 元/點
第二章 Low Dielectric Constant Material
7
0 元/點
第三章 Silicon on Insulator (SOI)
7
0 元/點
第四章 Magnetic Random Access Memory (MRAM)
9
0 元/點
第五章 Atomic Layer Deposition (ALD)
6
0 元/點
第六章 EUV Lithography
8
0 元/點
第七章 Conclusion
6
0 元/點
上一篇由國際大廠在中國大陸之投資佈局...
下一篇交換式電源產業市場競爭結構分析
熱門點閱
推薦閱讀
推薦新聞

若有任何問題,可使用下方檢索互動介面找解答,或是寫信到客服信箱。

itismembers@iii.org.tw

星期一~五
9:00-12:30/13:30-18:00